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Please address any queries regarding the group to :

Professor Harold Gamble

Microelectronics Group,

School of Electrical and Electronic Engineering, Queen's University Belfast, Ashby Building, Stranmillis Road, Belfast BT9 5AH, United Kingdom.

Tel.  : +44 (0)2890 975439

Fax. : +44 (0)2890 667023

Email : h.gamble@qub.ac.uk

 



Nano-Cavity Structures Formed by Implantation into Silicon

(by Dr. Richard Hurley)

Text Box: UHV cavities in silicon produced by helium implantation and annealing

The history of nano-cavities formed by implantation dates back to early observations of problems of swelling, exfoliation and release of gas that occurred in nuclear reactors, particle accelerators and the walls of experimental fusion devices. Of most concern was the implantation of insoluble inert species that formed small nanometer bubbles through a process of vacancy accumulation, This phenomena is of considerable current interest for applications in the semiconductor industry; helium and hydrogen implantation into silicon with subsequent annealing is used in SOI processing and we are investigating this for layer transfer applications in a wide sense.

Figs 1(a)-(c) shows the evolution of nanocavity development caused by annealing helium implanted silicon to various temperatures. These TEM photos show clearly the transition from platelet structures which appear at 4000C to lenticular and spherical cavities for temperatures higher than about 8000C. Platelet structures are of importance in thermal splitting of wafers and take different forms for hydrogen and helium implantation. This is shown in Fig 2 where hydrogen and helium have been co-implanted to slightly differing projected ranges. Co-implantation of these gases is of practical importance in lowering the total fluence requirements for thermal splitting.

 

Fig 1 (a) to (d)

Fig 2. When bonded to another wafer, studies show thermal splitting will occur at the H platelet line providing He implant is not first heated (before bonding) above 400°C. If He implant is first heated at 400-500°C, wafer splits along plane of He nanocavities. Above initial heating at 500°C,  partial splitting occurs.

 

Some applications of nanocavities 

  •    Gettering of impurities for improving lifetime in devices.

  •    A strain relaxation layer for thin Si/SiGe on insulator, (<30 nm)

  •    To reduce roughness in smart-cut with SiGe.

  •    Enhancement of light-emitters and Si-based opto-electronics.

  •    A cushion for relieving stress in thicker films.

  •    A weakening layer for mechanical splitting (layer transfer)

  •    A trap for hydrogen for thermal splitting.

  •    A trap for oxygen for SIMOX improvement.